• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
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  • 优先权
    • 专利摘要:
    AN APPARATUS TO INSPECT A FLOW OF MATTER AND A SYSTEM UNDERSTANDING THE SAME. The present invention relates to an apparatus (100) for inspecting a flow of matter (10) comprising: a first light source and a second light source (101; 102) for emitting a first beam of light and a second beam of light. light (111; 112); a first detector and a second detector (131; 132); a first scanning element (151) which is adapted to redirect the detection region (137) of the second detector from one side to the other side through said flow, and; a beam splitting element (140) which is arranged to receive said first beam of light and said second beam of light (111), after having been reflected against said matter, wherein said beam splitting element (140) is adapted to conduct said first beam of light (111) reflected in the direction of said first detector (131) and to conduct said second beam of light (112) reflected in the direction of said second detector (132).
    公开号:BR112016009951B1
    申请号:R112016009951-6
    申请日:2014-11-03
    公开日:2020-12-01
    发明作者:Hartmut Harbeck；Dirk Balthasar
    申请人:Tomra Sorting Nv；
    IPC主号:
    专利说明:

    [0001] [001] The present invention relates to an apparatus for inspecting a flow of matter, as well as a system comprising an apparatus of this nature.
    [0002] [002] EP 1 185 854 discloses a detection station including a video camera directed vertically downwards and a detection unit, in which the station presents a flow of residual material that advances through it on an essentially horizontal conveyor belt to the a transverse arrangement of air jet nozzles. The camera's rectangular imaging region covers the full width of the belt and therefore the flow of residual matter. The camera data is used to identify the positions of individual objects in the waste matter stream (in the direction of approximately the region that the object occupies in the waste matter stream). The unit sweeps the flow of residual matter along a straight path P that also extends over the full width of the belt and therefore the flow of residual matter, where the path P is perpendicular to the longitudinal direction D of the belt, that is to say in relation to the feed direction of the residual material flow. By analyzing the infrared spectrum, the unit detects the composition of at least some of the objects in the residual matter flow. The camera and unit data are used to control a controller for solenoid valves that control the compressed air supply to the respective nozzles. In this system, the composition and / or color of each object is / are detected by the unit, while the video camera is used to monitor the scanned region and the respective data output is used automatically to detect the positions of the objects and to correct data relating to these objects as received by detectors on the unit.
    [0003] [003] A problem related to the system mentioned above is for example that small objects can change position on the conveyor belt between the measurement by the detection unit and the camera. Therefore, it can be difficult to determine which readings belong to which item.
    [0004] [004] The present invention aims to provide an improved apparatus for inspecting a flow of matter. The present invention is defined in the independent claims and the embodiments are set out in the attached dependent claims.
    [0005] [005] In accordance with an aspect of the present invention, an apparatus is provided for inspecting a flow of matter, comprising a first light source and a second light source, a first detector and a second detector as well as a first scanning element and a first beam splitter. Said first light source is adapted to emit a first beam of light comprising wavelengths in a first range of wavelengths (λ1a-λ1b), to illuminate said flow of matter from one side to the other side, and; the first detector is arranged to receive said first beam of light after having been reflected against said flow of matter in a first detection region.
    [0006] [006] The second light source is adapted to emit a second beam of light comprising wavelengths in a second range of wavelengths (λ2a-λ2b), to illuminate the said flow of matter in an illuminated region, in which any wavelength (λ1) in said first wavelength range is different from any wavelength (λ2) in said second wavelength range (or λ1b <λ2a or λ2b <λ1a). The second detector is arranged to receive said second beam of light after having been reflected against said flow of matter in a second detection region.
    [0007] [007] Furthermore, the first scanning element is disposed between said flow of matter and said second detector and is adapted to redirect the second detection region from one side to the other side through said flow of matter. Finally, the beam splitting member is arranged to receive said first beam of light, after said first beam of light has been reflected against said matter along a first optical axis, and; is arranged to receive said second beam of light, after said second beam of light has been reflected against said matter along said first optical axis. Said beam splitting element is further adapted to conduct said first reflected light beam in the direction of said first detector and to conduct said second reflected light beam in the direction of said second detector redirecting one of said first beam of reflected light and said second beam of light reflected along a second optical axis not parallel to said first optical axis. More particularly, said scanning element is disposed between said beam splitting element and said second detector to receive only said second reflected light beam from said first reflected light beam and said second reflected light beam.
    [0008] [008] According to the present invention, the flow of matter that is inspected by the apparatus can consist of any objects suitable for optical inspection, such as, but not limited to, ores and minerals, food and bodies as well as waste and collected waste.
    [0009] [009] According to an example, said first light source can be selected from a group comprising lasers, super-continuous lasers, halogen lamps, light-emitting diodes, fluorescent tubes and combinations thereof.
    [0010] [0010] According to an example, said beam dividing element is a dichroic beam divider such as, but not limited to, a dichroic mirror, a dichroic reflector or a cube beam divider.
    [0011] [0011] Said first light source and said second light source are selected based on the optical properties of objects in said flow of matter and, more particularly, based on the optical properties of objects in said flow of matter which are of interest.
    [0012] [0012] According to an example, both said first light source and said second light source are line illuminations, which simultaneously illuminate the flow of matter from one side to the other side. Examples of these illuminations are halogen lamps, LED panels or laser (s) provided with suitable optics.
    [0013] [0013] According to another example, both said first light source and said second light source are spotlights, extensively illuminating said flow of matter from one side to the other side. Examples of these illuminations are LEDs or lasers provided with suitable optics. In this document, the terms spotlight and spotlight are used interchangeably.
    [0014] [0014] According to yet another example, one of said first light source and said second light source is line lighting and the other one between said first light source and said second light source is focus lighting.
    [0015] [0015] According to a first specific example, said line lighting is an LED panel comprising, for example, three lines of LEDs. The two outermost lines are, for example, green LEDs arranged side by side. The center line consists, for example, of groups of two IRs, and a red LED and there is an interstice between each group. In addition, between each pair of red LEDs there are two IR LEDs. Each LED is provided with optics that focus the light on the flow of matter.
    [0016] [0016] According to a second specific example, said focus illumination is a combination of lasers having different wavelengths, such as red, green and IR, in which the beams of the lasers are combined by polarizing beam splitters, in order to align the polarization of the laser beams, before the laser beams illuminate the flow of matter. More particularly, the first laser beam and the second laser beam (for example red and green) are combined by means of a first polarizing beam splitter to form an intermediate beam (red / green) and the intermediate beam (red / green) it is combined with the third laser beam (IR) by means of a second polarizing beam divider to form a resulting beam (red / green / IR). Lasers can, for example, be connected simultaneously, one by one or in pairs.
    [0017] [0017] Furthermore, according to an example, said first light source is arranged according to said first specific example and said second light source is arranged according to said second specific example.
    [0018] [0018] According to the present invention, the term wavelength range of a light source can be an individual wavelength, such as 632.8 nm from a HeNe laser, or; a first wavelength band, such as between 380 nm and 405 nm from a blue InGaN LED, or; a band of wavelengths, such as between approximately 450 nm and 650 nm of a white light LED in which GaN or InGaN from blue source pumps phosphorus Ce: YAG, or; up to a broader wavelength band, such as approximately 500 nm to 1500 nm from a 3300 K tungsten halogen lamp.
    [0019] [0019] According to the present invention for a first light source that is adapted to emit a total spectrum comprised for example between 500 nm - 1500 nm, the first wavelength range of the first light source corresponds to the portion of this spectrum total that is received by the first detector eg 500 nm - 900 nm. Similarly, for a second light source that is adapted to emit a total spectrum comprised, for example, between 500 nm - 1500 nm, the second wavelength range of the second light source corresponds to the portion of this total spectrum that is received by the second detector for example 1100 nm - 1500 nm.
    [0020] [0020] According to the present invention, the expression that any wavelength (λ1) in a first wavelength range is different from any wavelength (λ2) in a second wavelength range means that or all wavelengths in said first wavelength range are shorter than any wavelength (λ2) in a second wavelength range or that all wavelengths in said first wavelength range are longer longer than any wavelength (λ2) in the second wavelength range.
    [0021] [0021] According to the present invention a flow of matter is illuminated by at least a first light source and a second light source. The flow of matter has a direction of concrete movement and the width of the flow is measured in a direction orthogonal to the said direction of concrete movement. This first light source and second light source can illuminate the entire width of the flow or can illuminate a portion of it. To achieve a higher resolution, two devices can be used side by side; each featuring a first light source and a second light source, which are arranged so that the region illuminated by the respective apparatus is partially overlapping, so that the total width of the flux is only illuminated when both apparatus are used. The light sources are all arranged to illuminate the same side or the same face of the flux. According to another example, three or more devices are arranged side by side, so that the total flow is illuminated by overlapping light sources from the different devices. According to another example, only a portion of the flow is inspected, for example sufficient as a sample. In this case, a device can be used whose light sources only illuminate a portion, for example, between 20% and 80% of the flow width.
    [0022] [0022] In other words, in all cases there is a flow of matter comprising objects that are inspected and this inspected flow is illuminated from one side to the other side, that is to say from one side of the flow to the other side of the flow, through flow. The inspected flow can correspond to the total flow of matter or a portion of it and, therefore, the total flow or portion of it is illuminated from one side to the other by said apparatus.
    [0023] [0023] The fact that the flow of matter is illuminated from one side to the other side means that the flow of matter is illuminated transversely in relation to the respective feed direction. In addition, the light sources can be arranged in such a way that the region illuminated by the light sources is orthogonal in relation to the concrete movement direction of the flow of matter (called orthogonal illumination) or can be arranged so that the region illuminated by light sources is shifted by +/- 45 ° from orthogonal illumination.
    [0024] [0024] Illumination by a light source can be simultaneous or extensive, that is, the portion of the flow inspected by a corresponding apparatus (hereinafter referred to as "the inspected flow") can be illuminated simultaneously from one side to the other side through the flow, that is to say the total width of the inspected flow is illuminated at once; or it can be illuminated extensively from one side to the other side through the flow, that is to say the illuminated portion of the inspected flow (also called the illuminated region) is moved from one side of the inspected flow to the other by means of a redirecting element, such as like a moving mirror or similar. The illuminated region can have any shape, such as (but not limited to) a point, a spot, a circle, a line, a rectangle, a square or a combination thereof. In other words, when the inspected flow is illuminated extensively from one side to the other side, only a portion of the flow width is illuminated at each moment in time, and; when the inspected flow is illuminated simultaneously from one side to the other side, the total width of the inspected flow is illuminated at least one moment in time.
    [0025] [0025] According to an example, a system is provided comprising a first apparatus and a second apparatus, each arranged as described above, wherein said first apparatus is adapted to inspect a first portion of said flow and said second apparatus is adapted to inspect a second portion of said flow, wherein said first portion and said second portion only partially overlap. Said first apparatus and said second apparatus can be arranged side by side.
    [0026] [0026] According to an example, said apparatus comprises a first redirecting element which is arranged to receive said second light beam from said second light source and which is adapted to redirect said second light beam in order to extensively illuminate said flow of matter from one side to the other.
    [0027] [0027] According to yet another example, said scanning element and said first redirecting element are one and the same.
    [0028] [0028] According to yet another example, said apparatus comprises a second scanning element which is disposed between said flow of matter and said first detector, wherein said second scanning element is adapted to redirect said first region of detection from one side to the other side through said flow of matter.
    [0029] [0029] According to yet another example, said apparatus further comprises a second redirection element, which is disposed between said first light source and said flow of matter and which is adapted to receive said first beam of light from said first light source and to redirect said first light beam in order to extensively illuminate said flow from one side to the other side.
    [0030] [0030] According to the present invention the term cut-off wavelength or cut-off wavelength of the beam-splitting element is used to designate at which wavelength the division into a shorter wavelength range is performed. and a range of longer wavelengths.
    [0031] [0031] In other words, the beam splitting element divides the reflected light by the said flow of matter into two portions. A portion comprising wavelengths less than the cutting wavelength and another portion comprising wavelengths greater than or equal to the cutting wavelength. One of these portions is subsequently routed to the first detector and the other is routed to the second detector.
    [0032] In other words, said first scanning element can be arranged, between said beam splitting element and said second detector, in either of the two portions of the light reflected by said matter flow. That is, it may be arranged in the portion comprising wavelengths shorter than the cut-off wavelength or in the portion comprising wavelengths longer than the cut-off wavelength. Therefore, of said first reflected light beam and said second reflected light beam, the first scanning element receives only said second reflected light beam.
    [0033] [0033] In practice, in said portion comprising wavelengths that are shorter than the cut-off wavelength, there are usually also wavelengths which are longer than said cut-off wavelength, and; in said portion comprising wavelengths that are longer than the cut-off wavelength there are usually also wavelengths which are shorter than said cut-off wavelength, for example, due to the characteristics of the beam splitting element .
    [0034] [0034] However, looking at the energy content of said portion comprising wavelengths that are shorter than the cutting wavelength, a large part of the energy content consists of wavelengths that are shorter than the length cutting wavelength and a small part of the energy content consists of wavelengths that are longer than the cutting wavelength. The energy content is calculated using the formula E = hc / λ, where E represents the energy of a photon, h represents the Planck constant and c represents the speed of light. According to an example more than 80% or more than 90% or more than 95% of the energy content are made up of wavelengths that are shorter than the cut-off wavelength.
    [0035] [0035] Furthermore, looking at the energy content of said portion comprising wavelengths that are longer than the cutting wavelength, a large part of the energy content is made up of wavelengths that are longer than the cutting wavelength and a small part of the energy content consists of wavelengths that are shorter than the cutting wavelength. According to an example, more than 80% or more than 90% or more than 95% of the energy content consists of wavelengths that are longer than the cut-off wavelength. According to an example, said beam splitting element is adapted to conduct said second reflected light beam in the direction of said second detector along a second optical axis and to conduct said first reflected light beam in the direction of the first detector along a third optical axis and the angle between said second optical axis and said third optical axis is comprised between 20 ° and 160 ° or between 60 ° and 120 ° or between 80 ° and 100 °.
    [0036] [0036] The first light source may be adapted to emit a first spectrum, for example from 632.8 nm or 450 nm to 650 nm and the second light source may be adapted to emit a second spectrum, for example 500 nm at 1500 nm, where the spectra partially overlap. When the spectra partially overlap, it may be advantageous to have a filter element between one of the light sources and said material to be separated, in which the filter element is adapted to transmit or to forward only wavelengths in the range of wavelengths. wave from that light source. In other words, when a filter element is disposed between the first light source and the material to be separated, it preferably transmits or routes wavelengths in said first wavelength range. Alternatively or additionally, when the filter element is disposed between said second light source and said flow of matter, it is adapted to block wavelengths in said first wavelength range. Alternatively or additionally, when the filter element is disposed between said first light source and said flow of matter, it is adapted to block wavelengths in said second wavelength range.
    [0037] [0037] According to an example, said first detector comprises a CCD and in addition or alternatively said first detector is a line detector or a region detector. Fixed or adjustable filters, to filter a desired wavelength range can be provided in front of said first detector. When adjustable filters are used, different wavelength ranges can be filtered consecutively. Additionally or alternatively, the different filters can be provided in front of different parts of the detector, so that different regions of the detector receive different wavelengths.
    [0038] [0038] According to an example, said second detector comprises a CCD, wherein in addition or alternatively said second detector is a line detector or a region detector. Additionally or alternatively, said second detector may be a spectrometer or a sensor of a hyperspectral system. Fixed or adjustable filters, to filter a desired wavelength range can be provided in front of said second detector. When adjustable filters are used, different wavelength ranges can be filtered consecutively. In addition or alternatively, the different filters can be provided in front of different parts of the detector, so that different regions of the detector are sensitive to different wavelengths.
    [0039] [0039] According to the present invention the term first detection region refers to a portion of the flow of matter that is detected by said first detector at a time in time, and; the term second detection region refers to a portion of the flow of matter that is simultaneously detected by said second detector at a point in time. A detection region can cover the entire width of the inspected flow or can cover only a portion of it. When said detection region covers only a portion of the inspected flow, the detection region is displaced or swept from one side to the other side of the inspected flow by means of a redirecting element, such as a moving mirror or the like. The movable mirror is, for example, a polygonal mirror or a tilting mirror.
    [0040] [0040] According to an example, both said first light source and said second light source simultaneously illuminate the inspected flow from one side to the other side through the flow or the total width of the inspected flow, where the first The detection region simultaneously covers the inspected flow from one side to the other side, while the second detection region covers only a portion of the total width of the inspected flow and, therefore, extensively covers the inspected flow from one side to the other side.
    [0041] [0041] According to another example, said first light source simultaneously illuminates the flow inspected from one side to the other side, said second flow extensively illuminates the flow inspected from one side to the other side, where the first The detection region simultaneously covers the inspected flow from one side to the other side, while the second detection region covers only a small portion of the inspected flow and extensively covers the inspected flow from one side to the other side. In this case, or two different redirection elements can be used, one that redirects the illuminated region and one that redirects the detection region. Or, the same redirect element is used to redirect the highlighted region and the detection region.
    [0042] [0042] According to an example, the lighting of a connected light source is one and the same over time, which includes natural variations due to aging, variations in energy supply, etc. According to another example, the illumination of a light source varies over time according to a predetermined pattern, for example there may be a variation in the distribution of color and intensity. For example, there may be three cyclic colors. Variation in color can be achieved through the use of different light sources or through the use of a rotating filter in front of a light source with a wide spectrum.
    [0043] [0043] In addition, said light sources can be pulsed or continuous.
    [0044] [0044] The flow of matter can be transported by any means, such as, but not limited to, a free fall path, a chute or a conveyor belt.
    [0045] [0045] According to an example, a system is provided comprising an apparatus arranged as described above and means of transport for transporting the flow of matter, wherein said means of transport preferably include at least one of a conveyor belt, a rail flow and a free fall path.
    [0046] [0046] According to an example, a system is provided comprising a first apparatus and a second apparatus, each disposed as described above, wherein said first apparatus is adapted to inspect the first face of said flow and said second apparatus is adapted to inspect the second face of said flow, wherein said first face and said second face are opposite faces of said flow. In other words, the flow of matter is arranged to pass between said first apparatus and said second apparatus, for example in free fall or on a conveyor belt. The apparatus may be arranged to inspect essentially the same part of the flow, however from two opposite sides. These parts can be separated from each other, overlap or coincide. In other words, the region inspected by said first apparatus and said second apparatus may be adjacent to each other.
    [0047] [0047] The device can be an inspection device, measuring different properties of objects passing in the flow. It can also be a separation device that, based on the measured properties, makes the decision whether a specific object in the matter flow should be maintained or separated.
    [0048] [0048] According to an example, a system is provided comprising one or more devices arranged as described above. In addition, the stream of matter to be inspected comprises objects and said system further comprises processing means which are adapted to receive detection data from said first detector and said second detector and to transform said detection data into separation data , and; removal means which are adapted to receive removal data from said processing means and to remove objects from said flow of matter as a function of said separation data. The objects that are removed can be directed to a common point or, when desired, to different points depending on the detection data. Examples of removal means or means for separating objects are nozzles and ejectors.
    [0049] [0049] Details on how the detection data can be processed to determine whether an object should be removed or not, how the detection data should be processed to give rise to separation data as well as how the removal means should be formed and controlled are well known in the art and therefore will not be described in more detail in the present application.
    [0050] [0050] In the following the present invention will be described in more detail with reference to the accompanying figures showing embodiments of the present invention.
    [0051] [0051] FIG. 1a shows a schematic perspective view of an apparatus according to the present invention, wherein said first light source and said second light source are line lights.
    [0052] [0052] FIG. 1b shows a schematic top view illustrating the illuminated regions and fields of view of the apparatus described according to Figure 1a.
    [0053] [0053] FIG. 2a shows a schematic perspective view of an apparatus according to the present invention, wherein said first light source is line lighting and said second light source is scanned by means of a polygonal mirror.
    [0054] [0054] FIG. 2b shows a schematic top view illustrating the illuminated regions and the field of view of the apparatus described according to Figure 2a.
    [0055] [0055] FIG. 3 illustrates an alternative orientation of the illuminated regions and the field of view.
    [0056] [0056] FIG. 4 schematically illustrates the use of the apparatus to separate a flow of matter on a conveyor belt.
    [0057] [0057] FIG. 5 exemplifies the spectrum of different halogen lamps.
    [0058] [0058] FIG. 6 exemplifies the transmission of a filter.
    [0059] [0059] FIG. 7 exemplifies the transmission of a beam splitter.
    [0060] [0060] Figure 1 schematically illustrates an apparatus 100 for inspecting a flow of matter 10. The arrows in Figure 1a and 1b illustrate the direction of transport of the flow of matter or the clear direction of movement of said matter or the direction of feeding.
    [0061] [0061] The apparatus 100 comprises a first light source 101, which is adapted to emit a first beam of light 111 comprising wavelengths in a first range of wavelengths (λ1a-λ1b) to illuminate said flow of matter from one side to the other side. The first light source is a line illumination that simultaneously illuminates said flow of matter 10 from one side 13 to the other side 14.
    [0062] [0062] The apparatus 100 further comprises a second light source 102 which is adapted to emit a second beam of light 112 comprising wavelengths in a second range of wavelengths (λ2a-λ2b) to illuminate said flow of matter in a second illuminated region 117. The second light source is a line illumination that simultaneously illuminates said flow of matter 10 from one side 13 to the other side 14. Furthermore, any wavelength (λ1) in said first range of wavelengths of said first light source are different from any wavelength (λ2) in said second wavelength range of said second light source (λ1b <λ2a or λ2b <λa).
    [0063] [0063] The first beam of light 111 is reflected by said flow of matter in the direction of a beam splitting element 140. The beam dividing element 140 is arranged to receive said first beam of light 111, after having been reflected against said matter along a first optical axis 121, and; is arranged to receive said second beam of light 112, after said second beam of light has been reflected against said matter equally along said first optical axis 121. The beam splitting element 140, for example a dichroic mirror, it is further adapted to conduct said first beam of light 111 reflected in the direction of a first detector 131, and; to conduct said second reflected light beam 112 towards said second detector 132 by redirecting one of the first reflected light beam and the second reflected light beam along a second optical axis 122 not parallel to said first axis optical 121. More particularly, said scanning element 151 is arranged between said beam splitting element 140 and said second detector 132 to receive only said second reflected light beam from said first reflected light beam and the second beam of reflected light.
    [0064] [0064] Furthermore, said first detector 131 is adapted to receive said first light beam 111 after having been reflected against said flow of matter 10 in a first detection region 136, and; said second detector 132 is adapted to receive said second light beam 112 after having been reflected against said flow of matter 10 in a second detection region 137. In addition, a first scanning element 151 is disposed between said matter flow 10 and said second detector 132 and is adapted to redirect said second detection region 137 from one side to the other side through said matter flow.
    [0065] [0065] Figure 1b illustrates the first illuminated region 116 or the region 116 illuminated by said first light source 101. According to this example the first light source is a line illumination comprising LED lamps that simultaneously illuminates the total width of the flow and the first illuminated region is a rectangle that extends from one side to the other side through the flow of matter. LED lamps can be pulsed or continuous. In addition, according to this example, the first detector 131 is a line detector or a region detector (the sensors in the detector are arranged in a line or in a matrix) which is adapted to simultaneously detect the total width of the matter flow . The field of view 136 of said first detector or first detection region 136 corresponds to a rectangle that extends from one side to the other side through the flow of matter. The first detection region 136 is located in said first illuminated region 116.
    [0066] [0066] In addition, the region 117 illuminated by said second light source 102 or the second illuminated region 117 is also indicated in Figure 1b. According to this example the second light source is a line illumination comprising a laser and the second illuminated region is a line that extends from one side to the other side through the flow of matter. The laser can be pulsed or continuous. In addition, according to this example, the second detector 132 is a spectrometer that is adapted to extensively detect the total width of the matter flow. The field of view 137 of said second detector or second detection region 137 corresponds to a focus. The field of view 137 of said second detector or second detection region 137 is moved from one side to the other side through the flow of matter by means of a scanning element 151, in this case a tilting mirror.
    [0067] [0067] According to a first example, said first light source and said second light source are adapted to illuminate the flow of matter both at the same time. According to a second example, said first light source and said second light source are adapted to illuminate the flow of matter consecutively, that is to say first that said first light source is lit and subsequently said second light source is illuminated. and subsequently the lighting sequence is repeated several times. According to a third example, a combination of examples one and two is used, that is to say the light sources are sometimes illuminated simultaneously and sometimes are illuminated consecutively according to a predetermined lighting sequence.
    [0068] [0068] The first light source can be any suitable lighting and comprises, for example, a laser, light-emitting diodes, fluorescent tubes or a combination thereof. The first light source can emit radiation in the ultraviolet (UV) range, in the visible range (VIS), in the near infrared (NIR) range or in the medium infrared (MIR) range or in a combination of these ranges.
    [0069] [0069] The second light source can be any suitable lighting and comprise, for example, halogen lamps. The second light source can emit radiation in the ultraviolet (UV) range, in the visible range (VIS), in the near infrared (NIR) range or in the medium infrared (MIR) range or in a combination of these ranges.
    [0070] [0070] Optionally, a filter element can be arranged between the first light source and the flow of matter, in which the filter element is selected for example in a way that removes wavelengths emitted by said first light source that disturb the second detector; additionally or alternatively, a filter element can be arranged between the first light source and the stream of matter, in which the filter element is selected for example in a way that removes wavelengths emitted by said first light source which disturb the second detector.
    [0071] [0071] According to an example, the wavelengths of said first wavelength range are shorter than the wavelengths of said second wavelength range. In addition, said second light source emits wavelengths not only in said second wavelength range, but also in the range of said first wavelength range and the cutting wavelength of said beam splitter, in that wavelengths are disruptive to measurements made using said first detector. A filter element may be arranged between said second light source and said stream of matter, wherein the filter element removes wavelengths emitted by said second light source that are shorter than said wavelength of cutting or said filtering element removes wavelengths that are in the range of said first wavelength range and the cutting wavelength of said beam splitter. Therefore, the second light source does not disturb the first detector.
    [0072] [0072] According to an example, the wavelengths of said first wavelength range are shorter than the wavelengths of said second wavelength range. In addition, said second light source emits wavelengths not only in said first wavelength range, but also in the range of said second wavelength range and the cutting wavelength of said beam splitter, in that the wavelengths are disturbing for the measurements made using the said second detector. A filter element may be arranged between said first light source and said stream of matter, wherein the filter element removes wavelengths emitted by said first light source that are longer or equal to said wavelength. cutting edge or said filtering element removes wavelengths that lie in the range of said second wavelength range and the cutting wavelength of said beam splitter. Therefore, the first light source does not disturb the second detector.
    [0073] [0073] Similar solutions may be applied when the wavelengths of said first wavelength range are longer than the wavelengths of said second wavelength range.
    [0074] [0074] The apparatus illustrated in Figures 2a and 2b is the same as that described according to Figures 1a and 1b, except for the details mentioned below. The tilting mirror is replaced by a polygonal mirror 151, which is arranged to rotate around its respective central axis, for example by means of a motor (not shown). The second illumination is not a line illumination, but a focus illumination. The first light source 101 comprises two separate lamps 101a, 101b, which are arranged one on each side of the flow of matter. Both lamps illuminate essentially the same first illuminated region 116 in the flow of matter. The second light source 102 comprises two separate light sources 102a, 102b. The region 117a, 117b illuminated by said second light source 102 or the second illuminated region 117a, 117b is indicated in Figure 1b. According to this example, the second light source is a spot illumination comprising a laser, illuminating only a portion of said matter flow. The laser can be pulsed or continuous. The redirect element 151 is arranged to extensively move the second illuminated region 117a, 117b from one side to the other side through said flow of matter.
    [0075] [0075] Furthermore, according to this example the second detector 132 is a spectrometer that is adapted to extensively detect the total width of the matter flow. The field of view 137 of said second detector or second detection region 137 corresponds to a focus. The field of view 137 of said second detector or second detection region 137 can be moved from one side to the other side through the flow of matter by means of a scanning element 151, in this case a polygonal mirror. The second detection region 137 is located in the region illuminated by said second light source 117a, 117b.
    [0076] In other words, said second light source 102 illuminates said flow of matter 10 in a second illuminated region 117a, 117b covering only a portion of the width of said flow of matter and a redirect element 151 is arranged to receive said second light beam 112a, 112b of said second light source 102 and is adapted to redirect said second light beam so as to move said first illuminated region 117a, 117b from one side to the other side through said flow of matter, wherein preferably said redirecting element and said first scanning element, described according to Figure 1a, are one and the same.
    [0077] [0077] According to a detailed example the first light source comprises LEDs that emit white light, for example Z-Power LEDs manufactured by Seol Semiconductor and emitting light by Pure White, and; more particularly, belonging, for example, to A0-A5, B0-B5 or C0-C5, which are described in more detail in the product specification, that is to say vastly in the CIE coordinates (0.3028, 0.3304) (0.3552, 0.3760) (0.3514, 0.3487) 0.3113) (0.3028, 0.3304). LEDs simultaneously illuminate the flow of matter from one side to the other side. The second light source is one of the halogen lamps, whose spectra are illustrated in Figure 5. The top line is the spectral distribution of a 3300 K lamp, the bottom line is the spectral distribution of a 3200 K lamp, the one below this is the spectral distribution of a 3000 K lamp, the one below this is the spectral distribution of a 2800 K lamp, the one below this is the spectral distribution of a 2500 K lamp and the bottom one is the spectral distribution of a 2000K lamp. The second light source simultaneously illuminates the flow of matter from one side to the other side. A filter showing the transmission illustrated in Figure 6, that is, a cut-off wavelength of approximately 850 nm, is arranged between the second light source and the flow of matter. A dichroic mirror with a transmission as shown in Figure 6 is selected, that is, a cutting wavelength of approximately 1200 nm, as a beam splitting element. The first detector is an RGB camera and the second detector is an NIR spectrometer. The cut-off wavelength (approximately 1200 nm) of the spectrometer is also shown in Figure 5.
    [0078] [0078] When the first light source and the second light source are illuminated simultaneously, the light from both light sources reaches the beam divider and is divided into a first portion essentially consisting of a wavelength less than that length cutting wavelength and a second portion essentially consisting of a wavelength longer than said cutting wavelength. The first portion is reflected by said beam divider towards the first detector and the second portion is transmitted by said beam divider towards said second detector. In other words, essentially only the light from said first light source is transmitted to said first detector and essentially only light from said second light source is transmitted to said second detector.
    [0079] [0079] In practice, in said first portion there are wavelengths that are longer than said cutting wavelength and in said second portion there are wavelengths that are shorter than said cutting wavelength, due to the characteristics of the filter and the beam splitter.
    [0080] [0080] However, looking at the energy content of the first portion, a large part of the energy content is made up of wavelengths that are shorter than the cutting wavelength and a small part of the energy content is made up of wavelengths that are longer than the cutting wavelength. The energy content is calculated using the formula E = hc / λ, where E represents the energy of a photon, h represents the Planck constant and c represents the speed of light. More particularly, more than 80% or more than 90% or more than 95% of the energy content is made up of wavelengths that are shorter than the cut-off wavelength.
    [0081] [0081] Furthermore, looking at the energy content of the second portion, a large part of the energy content is made up of wavelengths that are longer than the cutting wavelength and a small part of the energy content is made up for wavelengths that are shorter than the cutting wavelength. More particularly, more than 80% or more than 90% or more than 95% of the energy content consists of wavelengths that are longer than the cut-off wavelength.
    [0082] [0082] An illumination of said matter flow from one side to the other side includes, but is not limited to, an illumination that is orthogonal in relation to the transport direction of said matter flow. As shown in Figure 3, an illumination of said flow of matter from one side to the other side can be displaced from an orthogonal illumination by, for example, 25 °.
    [0083] [0083] Figure 4 illustrates an application of the device described above. The light reflected by a stream of matter is received by a beam splitting element 140 and divided into two portions depending on the wavelength and each portion is sent to a corresponding detector 131, 132. Based on the properties determined by the corresponding detector and analyzed by a 410 processing apparatus; the objects 10 in the flow of matter are separated in a first container and a second container 431, 432 using a pressurized air separation apparatus 420. That is to say when an object must be placed in the right container, a breath of air is emitted that pushes the object into the right container.
    [0084] In other words, a system is provided comprising an apparatus arranged as described for example according to Figures 1 to 3. Furthermore, the flow of matter to be inspected comprises objects 10 and said system further comprises processing means 410 which are adapted to receive detection data from said first detector and from said second detector 131, 132 and to transform them into separation data, and; removal means 420 which are adapted to receive separation data from said processing means and to remove objects from said flow of matter depending on said separation data. The separation data can be indicative, for example, of the fact that the objects must be placed in the left container or in the right container 431, 432. In addition, the objects that are removed can be directed to a common point or alternatively to several different points in detection data.
    [0085] [0085] It is evident to the person skilled in the art that the present invention is not limited to the above described embodiments. On the contrary, various modifications and variations can be made within the scope of the appended claims.
    [0086] [0086] For example, lighting can be arranged under the flow of matter instead of being arranged over the flow of matter, as long as the conveyor belt is transparent. The conveyor belt can be replaced by a chute or a free fall path. The scanning element can be arranged between said beam splitter and said second detector, in a light path that is redirected by said beam splitting element, that is to say in a light path that is not parallel with respect to said first optical axis. In addition, additional light sources and detectors can be used, presenting a configuration similar to that described above, that is, in which the light passes through a dichroic mirror before reaching the detector. In addition, combinations of light sources and detectors can be freely chosen, provided the principles described in this document are used.
    权利要求:
    Claims (21)
    [0001]
    APPLIANCE (100) FOR INSPECTING A FLOW OF MATTER (10), characterized by comprising: - a first light source (101) which is adapted to emit a first beam of light (111) comprising wavelengths in a first range of wavelengths (λ1a-λ1b), to illuminate said flow of matter from one side to the other side and, - a first detector (131) that is arranged to receive said first beam of light (111) after having been reflected against said flow of matter (10) in a first detection region (136), - a second light source (102) which is adapted to emit a second beam of light (112) comprising wavelengths in a second range of wavelengths (λ2a-λ2b), to illuminate said flow of matter in a region illuminated (117), wherein any wavelength (λ1) in said first wavelength range is different from any wavelength (λ2) in said second wavelength range, - a second detector (132) which is arranged to receive said second light beam (112) after having been reflected against said flow of matter (10) in a second detection region (137), - a first scanning element (151) which is arranged between said flow of matter (10) and said second detector (132) and which is adapted to redirect the second detection region (137) from one side to the other side through that flow, further comprising - a beam splitting element (140) which is arranged to receive said first beam of light (111), after said first beam of light has been reflected against said matter along a first optical axis (121), and which is arranged to receive said second light beam (112), after said second light beam has been reflected against said matter along said first optical axis (121); wherein said beam splitting element (140) is adapted to conduct said first beam of light (111) reflected in the direction of said first detector (131) and to conduct said second beam of light (112) reflected in the direction said second detector (132) redirecting one between said first beam of light and said second beam of light along a second optical axis (122) not parallel to said first optical axis (121), wherein said scanning element (151) is arranged between said beam splitting element (140) and said second detector (132) to receive only said second beam of light reflected from said first beam of light and said second reflected light beam, and wherein said beam splitting element (140) is a dichroic mirror.
    [0002]
    APPARATUS, according to claim 1, characterized in that said second light source (102) is adapted to illuminate said flow of matter (10) simultaneously from one side to the
    [0003]
    APPARATUS, according to claim 1, characterized in that it further comprises a first redirection element which is arranged to receive said second light beam (112) from said second light source (102) and which is adapted to redirect said second beam of light to exhaustively illuminate said flow from one side to the other side.
    [0004]
    APPARATUS, according to claim 3, characterized in that said redirecting element and said first scanning element are one and the same.
    [0005]
    APPLIANCE according to any one of claims 1 to 4, characterized in that it further comprises a second scanning element that is arranged between said flow of matter (10) and said first detector (131), wherein said second scanning element scanning is adapted to redirect said first detection region (136) from one side to the other side through said flow of matter.
    [0006]
    APPARATUS, according to claim 5, characterized in that it further comprises a second redirection element which is adapted to receive said first light beam (111) from said first light source (101) and to redirect said first light beam in order to exhaustively illuminate said flow from one side to the other side.
    [0007]
    Apparatus according to any one of claims 1 to 5, characterized in that said first light source (101) is adapted to illuminate said flow of matter (10) simultaneously from one side to the other side.
    [0008]
    APPLIANCE according to any one of claims 1 to 7, characterized in that said beam splitting element (140) is adapted to conduct said second beam of light (112) reflected in the direction of said second detector (132) along a second optical axis and to conduct said first beam of light (111) reflected in the direction of said first detector (131) along a third optical axis and in which the angle between said second optical axis (122) and said the third optical axis (121) is between 20 ° and 160 ° or between 60 ° and 120 ° or between 80 ° and 100 °.
    [0009]
    APPLIANCE according to any one of claims 1 to 8, characterized in that said scanning element is one of a polygonal mirror and a tilting mirror.
    [0010]
    Apparatus according to any one of claims 1 to 9, characterized in that said first light source is selected from a group comprising lasers, super-continuous lasers, halogen lamps, light-emitting diodes, fluorescent tubes and combinations thereof.
    [0011]
    APPLIANCE according to any one of claims 1 to 10, characterized in that said second light source is selected from a group comprising halogen lamps, light-emitting diodes, lasers and super-continuous lasers and combinations thereof.
    [0012]
    Apparatus according to any one of claims 1 to 11, characterized in that the first light source is adapted to emit a first spectrum comprising said first light beam and the second light source is adapted to emit a second spectrum comprising said beam of light, wherein said first spectrum and said second spectrum are partially overlapping.
    [0013]
    APPLIANCE according to claim 12, characterized in that said apparatus further comprises a filter element (141) which is disposed between said second light source (102) and said material to be separated (10), wherein the element filtering is adapted to block the wavelength within said first wavelength range (λ1a-λ1b).
    [0014]
    Apparatus according to any one of claims 1 to 13, characterized in that said first detector is one of a line detector and a region detector.
    [0015]
    SYSTEM UNDERSTANDING A FIRST APPARATUS AND A SECOND APPLIANCE, RESPECTIVELY, as defined in claim 1, characterized in that said first apparatus is adapted to inspect a first portion of said flow and said second apparatus is adapted to inspect a second portion of said flow, in that said first portion and said second portion are only partially overlapping.
    [0016]
    SYSTEM UNDERSTANDING THE APPLIANCE, as defined in any one of claims 1 to 14 and means of transport for transporting the flow of matter, characterized in that said means of transport preferably include at least one of a conveyor belt, a flow chute and a path of free fall.
    [0017]
    SYSTEM UNDERSTANDING A FIRST APPARATUS AND A SECOND APPLIANCE, RESPECTIVELY, as defined in claim 1, characterized in that said first apparatus is adapted to inspect a first face of said flow and said second apparatus is adapted to inspect a second face of said flow, in that said first face and said second face are opposite faces of the flow.
    [0018]
    SYSTEM, according to claim 17, characterized in that the region inspected by said first apparatus and said second apparatus are adjacent to each other.
    [0019]
    SYSTEM UNDERSTANDING THE APPLIANCE, as defined in claim 1, characterized by the said flow of matter comprising objects (10) and said system further comprising - processing means (410) which are adapted to receive detection data from said first detector and said second detector (131, 132) and to transform said detection data into separation data; and - removal means (420) which are adapted to receive separation data from said processing means and to remove objects from said flow of matter depending on said separation data.
    [0020]
    APPARATUS according to any one of claims 1 to 14, characterized in that the first wavelength range (λ1a-λ1b) is reflected by said beam splitting element (140), and said second wavelength range (λ2a) -λ2b) be transmitted by said beam splitting element (140).
    [0021]
    APPARATUS according to any one of claims 1 to 14 and 20, characterized in that the wavelength in said first wave length is less than the wavelength in said second wave length range (λ1b-λ2a).
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    同族专利:
    公开号 | 公开日
    PE20160964A1|2016-10-16|
    UA121305C2|2020-05-12|
    RU2016119494A|2017-12-11|
    AU2014343597B2|2019-09-12|
    WO2015063300A1|2015-05-07|
    PL3066456T3|2020-11-16|
    CN105874321A|2016-08-17|
    ES2811601T3|2021-03-12|
    RU2664793C2|2018-08-22|
    JP2016540996A|2016-12-28|
    RU2016119494A3|2018-05-15|
    CN105874321B|2019-06-28|
    CA2928878A1|2015-05-07|
    JP6668249B2|2020-03-18|
    US20160252461A1|2016-09-01|
    CA2928878C|2020-06-23|
    CL2016001058A1|2016-12-02|
    EP3066456B1|2020-06-03|
    AU2014343597A1|2016-05-19|
    MX2016005836A|2016-12-02|
    SA516371056B1|2018-02-25|
    US9575005B2|2017-02-21|
    EP3066456A1|2016-09-14|
    MX360408B|2018-10-29|
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    法律状态:
    2020-03-17| B06U| Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette]|
    2020-07-28| B09A| Decision: intention to grant [chapter 9.1 patent gazette]|
    2020-12-01| B16A| Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]|Free format text: PRAZO DE VALIDADE: 20 (VINTE) ANOS CONTADOS A PARTIR DE 03/11/2014, OBSERVADAS AS CONDICOES LEGAIS. |
    优先权:
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    EP13191395|2013-11-04|
    EP13191395.6|2013-11-04|
    PCT/EP2014/073578|WO2015063300A1|2013-11-04|2014-11-03|Inspection apparatus|
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